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Characterization of thin-film PV modules

Photon etc is partnering with IRDEP (Insitute of Research and Development on Photovoltaic Energy) to develop a unique optical instrument for characterization of thin-film photovoltaics (PVs).

Based on volume Bragg gratings, Photon etc’s hyperspectral technology allows the collection of complete spectral images of large samples, replacing time-consuming x-y scanning spectroscopy. The technology is perfectly suited to the increasing demand for fast and efficient quality control in the solar cell industry. Due to the increasing demand for clean energies, the photovoltaic market is one of the fastest growing markets in high-tech devices.

The instrument is particularly adapted to thin-film PVs, the most promising candidate for low-cost solar generation of electricity. The mapping system will capture errors at an early stage of fabrication, lowering the number of defective cells and the overall fabrication cost. The characterization platform includes photoluminescence, electroluminescence, and diffuse reflectance measurement.